Flexible inspection of very small to medium-sized parts
The Comet Yxlon FF35 CT, FF35 CT Metrology, and FF35 CT SEMI cover an extraordinary range of applications. Capabilities include improved material testing in the R&D department, optimization of process control and small series inspection as well as various scientific applications. The dual X-ray tube set-up enables the high-resolution CT system to significantly expand quality assurance and research possibilities in the automotive, electronics, aviation, and material science industries.
With its optional dual-tube set-up, the FF35 CT combines unprecedented CT data quality with the highest versatility when inspecting small and medium-sized parts.
FF35 CT
Series:
FF series
Industry:
Automotive, Aerospace, Science & research, Welds, Foundries, Add. manufacturing
Defect size:
<1µm Defect, <50µm Defect, <1mm Defect, >1mm Defect
Part Size:
Small Size, Medium Size, Large Size
Mode of operation:
3D, 2D/3D, Metrology
FF35 CT highlights
Single or dual tube configuration for highest versatility in laboratory micro-CT applications
Switch between 225 kV micro-focus and 190 kV nano-focus tubes in seconds with the touch of a single button
Accurate results due to granite-based manipulation and air conditioning
Application flexibility due to various CT trajectories and FoV extensions via software platform Geminy
Optional metrology version with an MPESD = 5.9 µm + L/75 [L in mm]
Available as FF35 CT SEMI version in compliance with semiconductor market standards
Which items can be inspected with the FF35 CT?
Electronic components incl. SMD
Products involving new materials or new manufacturing methods, e.g., additively manufactured components, fiber-reinforced plastics
Battery cells and modules
Injection molded plastics
Microsystems (MEMS, MOEMS)
Medical objects, e.g., cannulas
Light-alloy castings
Geological, paleontological and biological samples
Which applications is the FF35 CT designed for?
Quality assurance, material analysis, and research
Failure and structure analysis
Assembly checking
Inspection of small serial productions
Process control
Digitization
Segmentation
FF35 CT SEMI: Developed for applications in the semiconductor field
The Comet Yxlon FF35 CT SEMI X-ray system is an innovative, versatile high-resolution CT system for use in research and development and quality assurance. It was developed specifically for inspections in semiconductor-related industries. The FF35 CT SEMI meets the high SEMI® standards, including the hazard and safety standards SEMI® S2-0818 & SEMI® S8-0218, and is certified accordingly.
Measuring the finest inner structures with the FF35 CT Metrology
The Comet Yxlon FF35 CT Metrology takes the accuracy of CT-based dimensional control, e.g., measurements of finest inner structures, to the next level . It captures nearly unlimited measuring points in one CT scan decoupled from the measurement evaluation. Seamless defect analysis and nominal-actual comparison save time and reduce correction loops and correction costs for product samplings. The FF35 CT Metrology meets the standards of VDI/ VDE 2630.
Technical Data
| Attribute | Respective Value |
| Sample Diameter | 530 [mm] (20.9") |
| Sample Height | 800 [mm] (31.5") |
| Maximum Sample Weight | 27 [kg] |
| System Dimension | 2960 x 1590 x 2120 [mm] |
| X-ray Tube | Y.FXT 225.48 directional beam tube, additional optional Y.FXT 190.61 transmission tube |
| CT Modes | QuickScan®, QualityScan, cone-beam CT, helical CT, virtual rotation axis, FoV extensions, volume crop |
| Manipulation | granite-based, active air damping, 6 to 8 axes, wide FDD range |